An image captured by Michael Deagen, Ph.D. research assistant in the Smart Lighting Engineering Research Center, recently earned first place in the Artistic Microscopy, Black & White category of the 2015 International Metallographic Contest sponsored by the International Metallographic Society.
“During my Versa Scanning Electron Microscope training, I took an image of one of the standard samples, a cross-section of a 500-um diameter cylinder of rolled graphene,” Deagen said. “At 5,000 times magnification under a 20kV beam, the image was rather striking and reminded me of the brushstrokes of a van Gogh painting.”
The International Metallographic Contest and Exhibit is being held in conjunction with the Microscopy & Microanalysis 2016 meeting and the 49th Annual IMS Meeting in Columbus, OH, July 24-28, 2016. The contest features the best work of metallographers and microstructural analysts from around the world.